MEASUREMENT OF THE SCATTERING FACTOR PHASE AND THE SPHERICAL AND ASTIGMATIC ABERRATION CONSTANTS FROM DIFFRACTOGRAMS OF ELECTRON-MICROGRAPHS

被引：0

作者：

KIHARA, H ^{[1
]}

ISHIGAKI, F ^{[1
]}

TAKAMIYA, K ^{[1
]}

KANAYA, K ^{[1
]}

机构：

[1] KOGAKUIN UNIV,DEPT ELECTR ENGN,NISHISHINJU KU,TOKYO 160,JAPAN

来源：

JOURNAL OF ELECTRON MICROSCOPY | 1980年 / 29卷 / 03期

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D O I：

暂无

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

引用

页码：276 / 277

页数：2

共 20 条

[1] MEASUREMENT OF THE SCATTERING FACTOR PHASE AND THE SPHERICAL AND ASTIGMATIC ABERRATION CONSTANTS FROM DIFFRACTOGRAMS OF ELECTRON-MICROGRAPHS
KANAYA, K
KIHARA, H
ISHIGAKI, F
MICRON, 1981, 12 (02) : 105 - 121
[2] FURTHER IMPROVED MEASUREMENT OF THE ANGULAR-DEPENDENCE OF COMPLEX SCATTERING FACTOR PHASE AND THE ABERRATION COEFFICIENT AS WELL AS THE PARTIAL COHERENCE ANGLE FROM DIFFRACTOGRAMS OF ELECTRON-MICROGRAPHS
KIHARA, H
TAKAMIYA, K
SHINO, M
OCHIAI, F
KANAYA, K
OIKAWA, T
JOURNAL OF ELECTRON MICROSCOPY, 1981, 30 (03): : 229 - 230
[3] DIFFRACTOGRAMS OF ELECTRON-MICROGRAPHS TAKEN WITH ASTIGMATIC OBJECT ILLUMINATION AND THE POSSIBILITIES OF THEIR APPLICATION FOR BRIGHTNESS MEASUREMENTS IN ASTIGMATIC BEAMS
HANSSEN, KJ
ADE, G
LAUER, R
OPTIK, 1986, 73 (04): : 163 - 173
[4] METHOD FOR DETERMINATION OF ANGLE OF ILLUMINATION FROM OPTICAL DIFFRACTOGRAMS OF ELECTRON-MICROGRAPHS
TROYON, M
JOURNAL DE MICROSCOPIE ET DE SPECTROSCOPIE ELECTRONIQUES, 1977, 2 (03): : A7 - A7
[5] DIGITAL PROCESSING OF LATTICE IMAGES FROM A DIFFRACTION SPOT SELECTED IN DIFFRACTOGRAMS OF ELECTRON-MICROGRAPHS
KANAYA, K
BABA, N
SHINO, M
TAKAMIYA, K
OIKAWA, T
MICRON, 1982, 13 (02) : 205 - 219
[6] COMPUTER-AIDED RECONSTRUCTION OF THE IMAGE-CONTRAST OF ATOM CLUSTERS FROM DIFFRACTOGRAMS OF ELECTRON-MICROGRAPHS
KANAYA, K
KIHARA, H
ISHIGAKI, F
TAKAMIYA, K
JOURNAL OF ELECTRON MICROSCOPY, 1980, 29 (03): : 318 - 319
[7] DETERMINATION OF ORDER PARAMETER AND ATOMIC SCATTERING FACTOR IN FEAL FROM THICKNESS FRINGES IN ELECTRON-MICROGRAPHS
MUKAI, T
KITAJIMA, S
KINOSHITA, C
JOURNAL OF THE PHYSICAL SOCIETY OF JAPAN, 1978, 45 (05) : 1676 - 1683
[8] COMPUTER-AIDED RECONSTRUCTION OF THE IMAGE-CONTRAST OF ATOM CLUSTERS FROM DIFFRACTOGRAMS OF ELECTRON-MICROGRAPHS
KANAYA, K
BABA, N
TAKAMIYA, K
MICRON, 1981, 12 (04) : 353 - 364
[9] MEASUREMENT OF INTRINSIC BOUNDARY DISLOCATION SPACINGS FROM ELECTRON-MICROGRAPHS
HOWELL, PR
JONES, AR
RALPH, B
SCRIPTA METALLURGICA, 1976, 10 (07): : 585 - 588
[10] CILIARY ORIENTATION - REPRODUCIBLE MEASUREMENT FROM ELECTRON-MICROGRAPHS OF RESPIRATORY CILIA
RAUTIAINEN, M
COLLAN, Y
NUUTINEN, J
JOURNAL OF ULTRASTRUCTURE AND MOLECULAR STRUCTURE RESEARCH, 1986, 94 (03): : 293 - 293

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