AN ULTRASENSITIVE RESONANCE IONIZATION MASS-SPECTROMETER FOR XENON

被引：0
|
作者：
GILMOUR, JD
LYON, IC
PERERA, IK
HEWETT, SM
JOHNSTON, WA
TURNER, G
机构：
来源：
INSTITUTE OF PHYSICS CONFERENCE SERIES | 1992年 / 128期
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D O I：
暂无
中图分类号：
O4 [物理学];
学科分类号：
0702 ;
摘要：
The sensitivity of our time-of-flight resonance ionization mass spectrometer has been increased by a factor of 100 by the addition of a cryogenic sample concentrator Evaluation of two-photon resonance schemes using wavelengths of 249.62nm, 252.50nm and 224.30nm shows the former to be the most sensitive.
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页码：19 / 22
页数：4
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