TEST SCHEDULING AND CONTROL FOR VLSI BUILT-IN SELF-TEST

被引：58

作者：

CRAIG, GL ^{[1
]}

KIME, CR ^{[1
]}

SALUJA, KK ^{[1
]}

机构：

[1] UNIV WISCONSIN,DEPT ELECT & COMP ENGN,MADISON,WI 53706

来源：

IEEE TRANSACTIONS ON COMPUTERS | 1988年 / 37卷 / 09期

关键词：

Manuscript received July 15; 1986; revised April 17; 1987. This work was supported in part by the National Science Foundation under Grants DCR-8206564 and DCR-8509194 and by the Australian Department of Science and Technology. G. L. Craig is with the Department of Electrical and Computer Engineering; Syracuse University; Syracuse; NY 13215. C. R. Kim and K. K. Saluja are with the Department of Electrical and Computer Engineering; University of Wisconsin; Madison; WI 53706. IEEE Log Number 8718428;

D O I：

10.1109/12.2260

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

引用

页码：1099 / 1109

页数：11

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