SIMPLE BRAGG-SPACING COMPARATOR

被引：36

作者：

ANDO, M

BAILEY, D

HART, M

机构：

来源：

ACTA CRYSTALLOGRAPHICA SECTION A | 1978年 / 34卷 / JUL期

关键词：

D O I：

10.1107/S0567739478001047

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

引用

页码：484 / 489

页数：6

共 11 条

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[6] DETERMINATION OF AVOGADRO CONSTANT [J].

DESLATTES, RD ;

HENINS, A ;

BOWMAN, HA ;

SCHOONOVER, RM ;

CARROLL, CL ;

BARNES, IL ;

MACHLAN, LA ;

MOORE, LJ ;

SHIELDS, WR .

PHYSICAL REVIEW LETTERS, 1974, 33 (08) :463-466

[7] HIGH PRECISION LATTICE PARAMETER MEASUREMENTS BY MULTIPLE BRAGG REFLEXION DIFFRACTOMETRY [J].

HART, M .

PROCEEDINGS OF THE ROYAL SOCIETY OF LONDON SERIES A-MATHEMATICAL AND PHYSICAL SCIENCES, 1969, 309 (1497) :281-&

[8] SILICON POWDER DIFFRACTION STANDARD REFERENCE MATERIAL [J].

HUBBARD, CR ;

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MAUER, FA .

JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1975, 8 (FEB1) :45-48

[9]

KOCK AJRD, 1971, J ELECTROCHEM SOC, V118, P1851

[10] HIGH-PRECISION MEASUREMENTS OF LATTICE-PARAMETER CHANGES IN NEUTRON-IRRADIATED COPPER [J].

LARSON, BC .

JOURNAL OF APPLIED PHYSICS, 1974, 45 (02) :514-518

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