ORIENTED TE THIN FILMS

被引：14
作者：
DUTTON, RW
MULLER, RS
机构：
[1] Department of Electrical Engineering and Computer Sciences, Electronics Research Laboratory, University of California, Berkeley
来源：
SOLID-STATE ELECTRONICS | 1969年 / 12卷 / 02期
基金：
美国国家航空航天局;
关键词：
D O I：
10.1016/0038-1101(69)90124-5
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
[No abstract available]
引用
收藏
页码：136 / &
相关论文
共 9 条
[1]  
BLAKEMORE JS, 1962, PROGRESS SEMICONDUCT, V6, P39
[2]  
BOLOTOV IE, 1966, OSV PHYS SOLID ST, V8, P1259
[3]  
GIBSON AF, 1962, PROGRESS SEMICOND ED, V6, P39
[4]   ULTRASONIC AMPLIFICATION IN TELLURIUM [J].
ISHIGURO, T ;
HOTTA, A ;
TANAKA, T .
JAPANESE JOURNAL OF APPLIED PHYSICS, 1966, 5 (04) :335-&
[5]  
NYE JF, 1967, PHYSICAL PROPERTIES, P122
[6]  
PLESSNER WK, 1951, P PHYS SOC B, V64, P671
[7]   PROHIBITED REFLEXES IN ELECTRON DIFFRACTION ON VACUUM EVAPORATED TELLURIUM LAYERS [J].
SCHUZ, W .
PHYSICA STATUS SOLIDI, 1968, 25 (01) :253-&
[8]  
SMITH JV, 1966, INDEX POWDER DIFF ED
[9]  
VONHIPPEL A, 1959, MOLECULAR SCIENCE MO, P296
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