CHEMICAL-BONDS STUDIED WITH FUNCTIONALIZED ATOMIC-FORCE MICROSCOPY TIPS

被引:113
|
作者
HAN, T [1 ]
WILLIAMS, JM [1 ]
BEEBE, TP [1 ]
机构
[1] UNIV UTAH,DEPT CHEM,SALT LAKE CITY,UT 84112
基金
美国国家科学基金会;
关键词
ATOMIC FORCE MICROSCOPY; HYDROGEN BONDS; SURFACE TECHNIQUES; THIOLS;
D O I
10.1016/0003-2670(94)00671-8
中图分类号
O65 [分析化学];
学科分类号
070302 ; 081704 ;
摘要
Chemically modified atomic force microscopy (AFM) tips were produced by using thiol molecules. A new statistical method which produces information about single chemical bond strength from the retracting part of the force-distance curves in AFM is discussed. Single hydrogen bonds between carboxylic acid groups on the tip and surface were detected, and the hydrogen bond energy between them was calculated. This measured single hydrogen bond strength shows variation in various liquid media. From the shape of the approaching part of the force-distance curves, we were able to confirm the presence of surface hydrogen bond forces, as well as infer other effects such as hydration shell and electric double-layer repulsion. The experiments represent an important step in rendering the information in AEM chemically specific.
引用
收藏
页码:365 / 376
页数:12
相关论文
共 50 条
  • [1] CHARACTERIZATION OF TIPS FOR CONDUCTING ATOMIC-FORCE MICROSCOPY
    OSHEA, SJ
    ATTA, RM
    WELLAND, ME
    REVIEW OF SCIENTIFIC INSTRUMENTS, 1995, 66 (03): : 2508 - 2512
  • [2] WEAR OF THE ATOMIC-FORCE MICROSCOPE TIP UNDER LIGHT LOAD, STUDIED BY ATOMIC-FORCE MICROSCOPY
    KHURSHUDOV, A
    KATO, K
    ULTRAMICROSCOPY, 1995, 60 (01) : 11 - 16
  • [3] Catalyst genesis studied by atomic-force microscopy.
    Bird, DPC
    de Castilho, CMC
    Lambert, RM
    ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 2000, 219 : U524 - U524
  • [4] INVESTIGATIONS OF LOADED CRACK TIPS IN NIAL BY ATOMIC-FORCE MICROSCOPY
    GOKEN, M
    VEHOFF, H
    NEUMANN, P
    SCRIPTA METALLURGICA ET MATERIALIA, 1995, 33 (07): : 1187 - 1192
  • [5] ATOMIC-FORCE MICROSCOPY
    BINNIG, GK
    PHYSICA SCRIPTA, 1987, T19A : 53 - 54
  • [6] ATOMIC-FORCE MICROSCOPY
    BLANCHARD, CR
    CAMPBELL, JB
    ADVANCED MATERIALS & PROCESSES, 1995, 148 (02): : 62 - 62
  • [7] CALIBRATION OF ATOMIC-FORCE MICROSCOPE TIPS
    HUTTER, JL
    BECHHOEFER, J
    REVIEW OF SCIENTIFIC INSTRUMENTS, 1993, 64 (07): : 1868 - 1873
  • [8] ACOUSTIC MICROSCOPY BY ATOMIC-FORCE MICROSCOPY
    RABE, U
    ARNOLD, W
    APPLIED PHYSICS LETTERS, 1994, 64 (12) : 1493 - 1495
  • [9] Image correction for atomic force microscopy images with functionalized tips
    Neu, M.
    Moll, N.
    Gross, L.
    Meyer, G.
    Giessibl, F. J.
    Repp, J.
    PHYSICAL REVIEW B, 2014, 89 (20):
  • [10] Theory of atomic-force microscopy
    Sasaki, N
    Tsukada, M
    SCIENCE REPORTS OF THE RESEARCH INSTITUTES TOHOKU UNIVERSITY SERIES A-PHYSICS CHEMISTRY AND METALLURGY, 1997, 44 (01): : 1 - 15