X-RAY DOUBLE-CRYSTAL DIFFRACTOMETRY OF GA1-XALXAS EPITAXIAL LAYERS

被引：255
作者：
BARTELS, WJ
NIJMAN, W
机构：
来源：
JOURNAL OF CRYSTAL GROWTH | 1978年 / 44卷 / 05期
关键词：
D O I：
10.1016/0022-0248(78)90293-2
中图分类号：
O7 [晶体学];
学科分类号：
0702 ; 070205 ; 0703 ; 080501 ;
摘要：
引用
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页码：518 / 525
页数：8
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