QUANTITATIVE STUDY OF AUGER-ELECTRON SIGNALS OF PHOSPHORUS ON SILICON USING A QUARTZ CRYSTAL MICROBALANCE

被引:23
作者
LEVENSON, LL
BRYSON, CE
DAVIS, LE
MELLES, JJ
KOU, WH
机构
来源
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY | 1972年 / 9卷 / 02期
关键词
D O I
10.1116/1.1317731
中图分类号
O59 [应用物理学];
学科分类号
摘要
引用
收藏
页码:608 / &
相关论文
共 13 条
[1]  
ARTHUR JR, 1969, STRUCTURE CHEMISTRY, P46
[2]   AUGER SPECTROSCOPY OF SILICON [J].
BISHOP, HE ;
RIVIERE, JC ;
TAYLOR, NJ .
SURFACE SCIENCE, 1969, 17 (02) :462-&
[4]  
LEVENSON LL, 1967, NUOVO CIMENTO, V5, P321
[5]  
NEEDHAM PB, 1971, 31 PHYS EL C
[6]   AUGER ELECTRON SPECTROSCOPY OF FCC METAL SURFACES [J].
PALMBERG, PW ;
RHODIN, TN .
JOURNAL OF APPLIED PHYSICS, 1968, 39 (05) :2425-&
[7]   QUANTITATIVE USE OF AUGER SPECTROSCOPY - CALIBRATION OF METHOD [J].
PERDEREAU, M .
SURFACE SCIENCE, 1971, 24 (01) :239-+
[9]   SURFACE COMPOSITION OF MICA SUBSTRATES [J].
POPPA, H ;
ELLIOT, AG .
SURFACE SCIENCE, 1971, 24 (01) :149-&
[10]   AUGER SPECTRA AND LEED PATTERNS FROM VACUUM CLEAVED SILICON CRYSTALS WITH CALIBRATED DEPOSITS OF IRON [J].
RIDGWAY, JWT ;
HANEMAN, D .
SURFACE SCIENCE, 1971, 24 (02) :451-&