ACCELERATED LIFE TESTING - STEP-STRESS MODELS AND DATA ANALYSES

被引：436

作者：

NELSON, W

机构：

来源：

关键词：

D O I：

10.1109/TR.1980.5220742

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

引用

页码：103 / 108

页数：6

共 16 条

[1]

ALLEN WR, 1965, NOTES SOME STATISTIC

[2] APPLICATION OF EYRING MODEL TO CAPACITOR AGING DATA [J].

ENDICOTT, HS ;

HATCH, BD ;

SOHMER, RG .

IEEE TRANSACTIONS ON COMPONENT PARTS, 1965, CP12 (01) :34-&

[3]

ENDICOTT HS, 1961, T AIEE POWER APPARAT, V80, P515

[4]

ENDICOTT HS, 1961, 7TH P NAT S REL QUAL, P229

[5]

HAHN GJ, 1967, STATISTICAL MODELS E

[6]

MANN NR, 1974, METHODS STATISTICAL

[7] ANALYSIS OF RESIDUALS FROM CENSORED DATA [J].

NELSON, W .

[8] SURVEY OF METHODS FOR PLANNING AND ANALYZING ACCELERATED TESTS [J].

NELSON, W .

IEEE TRANSACTIONS ON ELECTRICAL INSULATION, 1974, EL 9 (01) :12-18

[9]

NELSON WB, 1972, TIS72GEN009 GE CO CO

[10]

NELSON WB, 1978, TIS79CRD262 GE CO CO