ATOMIC RESOLUTION AND NANOSTRUCTURE OF YBA2CU3O7-DELTA LASER-ABLATED THIN-FILMS STUDIES BY SCANNING TUNNELING MICROSCOPY (STM)

被引：50

作者：

LANG, HP

FREY, T

GUNTHERODT, HJ

机构：

[1] Institut für Physik, Universität Basel, Basel, CH-4056

来源：

EUROPHYSICS LETTERS | 1991年 / 15卷 / 06期

关键词：

PEROVSKITE PHASE SUPERCONDUCTORS; ELECTRON MICROSCOPY DETERMINATIONS (INC SCANNING TUNNELING MICROSCOPY METHODS); THIN FILM; GROWTH; STRUCTURE; AND EPITAXY;

D O I：

10.1209/0295-5075/15/6/018

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

Scanning tunnelling microscopy (STM) is applied to investigate the surface structure of high-quality c-axis oriented laser-ablated thin YBa2Cu3O7-delta-films. The main features of the surface are steps of one-unit cell height documenting the two-dimensional growth process of the epitaxial film. For the first time atomic resolution with STM is achieved, indicating a 3.8 angstrom square lattice on YBa2Cu3O7-delta-laser-ablated films, as expected from diffraction techniques. Screw dislocations and holes of different sizes are the most frequently observed types of lattice defects in these films.

引用

页码：667 / 670

页数：4