TILTS: A Fast Architectural-Level Transient Thermal Simulation Method

被引:37
作者
Han, Yongkui [1 ]
Koren, Israel [1 ]
Krishna, C. M. [1 ]
机构
[1] Univ Massachusetts, Dept ECE, Amherst, MA 01002 USA
关键词
Thermal Simulation; Fast Method; Linear System; Performance Counters; Runtime Temperature Monitoring;
D O I
10.1166/jolpe.2007.106
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
As power density of microprocessors is increasing rapidly and resulting in high temperatures, the reliability of chips is greatly affected, making thermal simulation a necessity for CPU designs. Current thermal simulation methods (for example, the HotSpot simulator) are very useful, but are still inefficient when performing thermal analysis for long simulation times. In this paper, we propose a novel transient thermal simulation method for CPU chips at the architecture level, TILTS(Time Invariant Linear Thermal System), which utilizes the fact that the input power trace is discretized over a fixed sampling interval to accelerate thermal simulations. TILTSallo ws us to calculate transient temperatures on a chip over long simulation times. Based on a linear system formulation, TILTShas the same accuracy as that of traditional thermal simulation tools and is orders of magnitude faster than previous algorithms. Compared to the HotSpot simulator, TILTS achieves speedups of 1300 for the processors in our experiments for an appropriate sampling interval of 100 mu s. With some additional memory space, the improved algorithm CONTILTS(Con volutional TILTS) is about 6000 times faster than the HotSpot simulator for the processors in our experiments.
引用
收藏
页码:13 / 21
页数:9
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