EFFECT OF AXIAL PINHOLE DISPLACEMENT IN CONFOCAL MICROSCOPES

被引：22

作者：

KIMURA, S ^{[1
]}

WILSON, T ^{[1
]}

机构：

[1] UNIV OXFORD, DEPT ENGN SCI, OXFORD OX1 3PJ, ENGLAND

来源：

APPLIED OPTICS | 1993年 / 32卷 / 13期

关键词：

D O I：

10.1364/AO.32.002257

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

The effect of axial misalignment of the detector pinhole in confocal microscopes is investigated. We find that the use of a flat mirror to determine the axial position of the pinhole in a reflection microscope does not necessarily give the correct location. However, for a fluorescent microscope there is no uncertainty in determining the axial position of the pinhole by maximizing the fluorescence signal from a thin fluorescent film.

引用

页码：2257 / 2261

页数：5

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