DEPENDENCE OF BARKHAUSEN NOISE ON FILM PARAMETERS IN SHIELDED MR HEADS

被引：3

作者：

RAMESH, M

DEE, RH

FRANZEL, KS

机构：

[1] Storage Technology Corporation, Louisville

来源：

IEEE TRANSACTIONS ON MAGNETICS | 1993年 / 29卷 / 06期

关键词：

D O I：

10.1109/20.281309

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Barkhausen discontinuities in read waveforms from shielded MR heads have been isolated and analyzed using histograms and statistical methods, The data obtained has been found to be dependent on the test conditions and previous magnetic histories in addition to the magnetic properties of the element. For the heads studied, the Barkhausen noise is found to be affected primarily by easy axis misorientation, input flux excitation amplitude, element aspect:ratio and magnetic history and less so by magnetostriction coefficient.

引用

页码：3817 / 3819

页数：3

共 6 条

[1]

ABOAF JA, 1991, Patent No. 5001586

[2] EFFECT OF SENSE CURRENT ON BARKHAUSEN NOISE IN MAGNETORESISTIVE RECORDING-HEADS [J].