ANALYSIS OF A REPAIRABLE REDUNDANT SYSTEM WITH DELAYED REPLACEMENT

被引：5

作者：

AGARWAL, M ^{[1
]}

KUMAR, A ^{[1
]}

机构：

[1] DEF SCI LAB,DIV TRAINING,DELHI 110054,INDIA

来源：

MICROELECTRONICS AND RELIABILITY | 1981年 / 21卷 / 02期

关键词：

D O I：

10.1016/0026-2714(81)90385-1

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：165 / 171

页数：7

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