DEVICE FOR AUTOMATIC TEMPERATURE UPKEEPING BY STATIONARY MEASUREMENT METHOD OF THERMOELECTRIC SEMICONDUCTOR PARAMETERS AT 77-300 DEGREES K

被引:0
|
作者
BANAGA, MP
IONITSEL, AI
机构
来源
ZAVODSKAYA LABORATORIYA | 1972年 / 38卷 / 08期
关键词
D O I
暂无
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
引用
收藏
页码:1021 / &
相关论文
共 13 条
  • [1] TEMPERATURE DEPENDENCE OF LATTICE CONSTANTS OF YTTRIUM AT 77-300 DEGREES K
    FINKEL, VA
    VOROBEV, VV
    SOVIET PHYSICS CRYSTALLOGRAPHY, USSR, 1968, 13 (03): : 457 - &
  • [2] Fabrication of Low Cost and high precision Thermoelectric Power Setup in the Temperature Range of 77-300 K
    Hazra, S. K.
    Giri, S. K.
    Nath, T. K.
    PROCEEDINGS OF THE 59TH DAE SOLID STATE PHYSICS SYMPOSIUM 2014 (SOLID STATE PHYSICS), 2015, 1665
  • [3] Study of electronic and magnetic properties of the CuFeS2 semiconductor compound in the temperature range 77-300 K
    Khabibullin, I. Kh.
    Schmidt, E. V.
    Matukhin, V. L.
    SEMICONDUCTORS, 2009, 43 (13) : 1650 - 1653
  • [4] PARAMAGNETIC PROPERTIES OF SOME PD- AND PDH-BASED ALLOYS IN TEMPERATURE REGION 77-300 DEGREES K
    HUMBLE, SG
    ARKIV FOR FYSIK, 1968, 37 (06): : 609 - &
  • [5] DEVICE FOR MEASUREMENT OF SPECIFIC-HEAT CAPACITY AND THERMAL-DIFFUSIVITY WITHIN LOW-TEMPERATURE RANGE (77-300 K) BY IMPULSE-LIGHT METHOD
    NOVRUZOV, ON
    GADJIYEV, EM
    SEIDRZAYEVA, MM
    IZVESTIYA AKADEMII NAUK AZERBAIDZHANSKOI SSR SERIYA FIZIKO-TEKHNICHESKIKH I MATEMATICHESKIKH NAUK, 1980, (04): : 93 - 95
  • [6] Device for measurement the seebeck coefficient of thermoelectric materials in the temperature range 300–800 K
    A. V. Karpov
    A. E. Sytschev
    A. O. Sivakova
    Measurement Techniques, 2023, 66 : 628 - 635
  • [7] The Thermoelectric Power of Bi1-xSbx Films (0 x 0.15) on Mica and Polyimide Substrates in the Temperature Range of 77-300 K
    Suslov, M. V.
    Grabov, V. M.
    Komarov, V. A.
    Demidov, E. V.
    Senkevich, S. V.
    Suslov, A. V.
    SEMICONDUCTORS, 2019, 53 (05) : 589 - 592
  • [8] Device for measurement the seebeck coefficient of thermoelectric materials in the temperature range 300-800 K
    Karpov, A. V.
    Sytschev, A. E.
    Sivakova, A. O.
    MEASUREMENT TECHNIQUES, 2023, 66 (08) : 628 - 635
  • [9] A simple, versatile and high-precision quasi-adiabatic calorimeter for specific-heat measurement in the temperature range 77-300 K
    Varandani, D
    Bandyopadhyay, AK
    Yadav, VS
    Gmelin, E
    Narlikar, AV
    MEASUREMENT SCIENCE AND TECHNOLOGY, 1996, 7 (04) : 511 - 514
  • [10] A Method for In-Situ, Total Ionising Dose Measurement of Temperature Coefficients of Semiconductor Device Parameters
    Hofman, Jiri
    Holmes-Siedle, Andrew
    Sharp, Richard
    Haze, Jiri
    IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2015, 62 (06) : 2525 - 2531