SCANNING ELECTROMAGNETIC TRANSMISSION-LINE MICROSCOPE WITH SUB-WAVELENGTH RESOLUTION

被引：82
作者：
FEE, M
CHU, S
HANSCH, TW
机构：
[1] MAX PLANCK INST QUANTENOPT,D-8046 GARCHING,FED REP GER
[2] UNIV MUNICH,SEKT PHYS,D-8000 MUNICH 40,FED REP GER
来源：
OPTICS COMMUNICATIONS | 1989年 / 69卷 / 3-4期
关键词：
D O I：
10.1016/0030-4018(89)90103-X
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
引用
收藏
页码：219 / 224
页数：6
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