HIGH-RESOLUTION X-RAY SPECTROSCOPIC DIAGNOSTICS OF LASER-HEATED AND ICF PLASMAS

被引：42

作者：

HAUER, AA ^{[1
]}

DELAMATER, ND ^{[1
]}

KOENIG, ZM ^{[1
]}

机构：

[1] KMS FUSION INC, ANN ARBOR, MI USA

来源：

LASER AND PARTICLE BEAMS | 1991年 / 9卷 / 01期

关键词：

D O I：

10.1017/S0263034600002329

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

This article presents a review of X-ray spectroscopic diagnostic and measurement techniques as applied to laser plasma interaction and laser fusion studies. As a matter of definition we restrict our attention to the range of a several hundred eV to about 100 keV. We deal with both the basic measurement concepts and the instrumental techniques. First a brief review of the physical phenomena and parameter ranges involved is given. We then deal with specific X-ray spectroscopic instruments and methods that are useful in laser plasma X-ray spectroscopy. A discussion is given of various modeling techniques and how they can be compared with experimental measurements.

引用

页码：3 / 48

页数：46

共 123 条

[1]

ALEXANDROPOULUS NG, 1974, APPL SPECTROSC, V28, P2

[2] INTERPRETATION OF AN OPTICALLY THICK RESONANCE LINE EMITTED FROM LASER-HEATED SPHERICAL PLASMAS [J].