首页
学术期刊
论文检测
AIGC检测
热点
更多
数据
BASE WIDENING INTO EMITTER REGION OF AN N+NPN BIPOLAR-TRANSISTOR
被引:2
作者
:
REY, G
论文数:
0
引用数:
0
h-index:
0
机构:
LAB AUTOMATIQUE & ANALYSE SYST,F-31400 TOULOUSE,FRANCE
LAB AUTOMATIQUE & ANALYSE SYST,F-31400 TOULOUSE,FRANCE
REY, G
[
1
]
BAILBE, JP
论文数:
0
引用数:
0
h-index:
0
机构:
LAB AUTOMATIQUE & ANALYSE SYST,F-31400 TOULOUSE,FRANCE
LAB AUTOMATIQUE & ANALYSE SYST,F-31400 TOULOUSE,FRANCE
BAILBE, JP
[
1
]
MARTY, A
论文数:
0
引用数:
0
h-index:
0
机构:
LAB AUTOMATIQUE & ANALYSE SYST,F-31400 TOULOUSE,FRANCE
LAB AUTOMATIQUE & ANALYSE SYST,F-31400 TOULOUSE,FRANCE
MARTY, A
[
1
]
机构
:
[1]
LAB AUTOMATIQUE & ANALYSE SYST,F-31400 TOULOUSE,FRANCE
来源
:
SOLID-STATE ELECTRONICS
|
1977年
/ 20卷
/ 06期
关键词
:
D O I
:
10.1016/S0038-1101(77)81012-5
中图分类号
:
TM [电工技术];
TN [电子技术、通信技术];
学科分类号
:
0808 ;
0809 ;
摘要
:
引用
收藏
页码:545 / 549
页数:5
相关论文
共 3 条
[1]
CARRIER MOBILITIES IN SILICON EMPIRICALLY RELATED TO DOPING AND FIELD
CAUGHEY, DM
论文数:
0
引用数:
0
h-index:
0
CAUGHEY, DM
THOMAS, RE
论文数:
0
引用数:
0
h-index:
0
THOMAS, RE
[J].
PROCEEDINGS OF THE INSTITUTE OF ELECTRICAL AND ELECTRONICS ENGINEERS,
1967,
55
(12):
: 2192
-
+
[2]
ALTERNATIVE WAY FOR NUMERICAL STEADY-STATE ANALYSIS OF FORWARD-BIASED P-N-JUNCTION DEVICES
LETURCQ, P
论文数:
0
引用数:
0
h-index:
0
机构:
INST NATL SCI APPL TOULOUSE, AVE RANGUEIL, 31400 TOULOUSE, FRANCE
LETURCQ, P
YAGUE, AM
论文数:
0
引用数:
0
h-index:
0
机构:
INST NATL SCI APPL TOULOUSE, AVE RANGUEIL, 31400 TOULOUSE, FRANCE
YAGUE, AM
[J].
ELECTRONICS LETTERS,
1975,
11
(19)
: 465
-
466
[3]
YAGI H, 1974, DEC INT EL DEV M WAS, P262
←
1
→
共 3 条
[1]
CARRIER MOBILITIES IN SILICON EMPIRICALLY RELATED TO DOPING AND FIELD
CAUGHEY, DM
论文数:
0
引用数:
0
h-index:
0
CAUGHEY, DM
THOMAS, RE
论文数:
0
引用数:
0
h-index:
0
THOMAS, RE
[J].
PROCEEDINGS OF THE INSTITUTE OF ELECTRICAL AND ELECTRONICS ENGINEERS,
1967,
55
(12):
: 2192
-
+
[2]
ALTERNATIVE WAY FOR NUMERICAL STEADY-STATE ANALYSIS OF FORWARD-BIASED P-N-JUNCTION DEVICES
LETURCQ, P
论文数:
0
引用数:
0
h-index:
0
机构:
INST NATL SCI APPL TOULOUSE, AVE RANGUEIL, 31400 TOULOUSE, FRANCE
LETURCQ, P
YAGUE, AM
论文数:
0
引用数:
0
h-index:
0
机构:
INST NATL SCI APPL TOULOUSE, AVE RANGUEIL, 31400 TOULOUSE, FRANCE
YAGUE, AM
[J].
ELECTRONICS LETTERS,
1975,
11
(19)
: 465
-
466
[3]
YAGI H, 1974, DEC INT EL DEV M WAS, P262
←
1
→