X-RAY REFLECTIVITY FINE-STRUCTURE FROM HOMOGENEOUS MATERIALS IN THE HARD-ENERGY RANGE

被引:21
作者
BORTHEN, P
STREHBLOW, HH
机构
[1] Inst. fur Phys. Chemie und Elektrochemie, Dusseldorf Univ.
关键词
D O I
10.1088/0953-8984/7/19/012
中图分类号
O469 [凝聚态物理学];
学科分类号
070205 ;
摘要
To a good approximation, the x-ray reflectivity fine structure from homogeneous materials was found to be, in the hard-energy range, a linear superposition of the fine structures of the real and imaginary parts of the refractive index. As a consequence, a simple formula for the extraction of the absorption fine structure (EXAFS) from the reflectivity data is given. For a certain glancing angle, the Kramers-Kronig transform of the reflectivity fine structure is, to a constant factor, approximately equal to EXAFS. The magnitudes of the Fourier transform of the reflectivity fine structure and of EXAFS have for all glancing angles approximately the same shape.
引用
收藏
页码:3779 / 3787
页数:9
相关论文
共 7 条
[1]   X-RAY PHOTOABSORPTION OF SOLIDS BY SPECULAR REFLECTION [J].
BARCHEWITZ, R ;
CREMONESEVISICATO, M ;
ONORI, G .
JOURNAL OF PHYSICS C-SOLID STATE PHYSICS, 1978, 11 (21) :4439-4445
[2]  
BOSIO L, 1984, J ELECTROANAL CHEM, V180, P265, DOI 10.1016/0368-1874(84)83585-6
[3]   GLANCING-ANGLE EXTENDED X-RAY-ABSORPTION FINE-STRUCTURE AND REFLECTIVITY STUDIES OF INTERFACIAL REGIONS [J].
HEALD, SM ;
CHEN, H ;
TRANQUADA, JM .
PHYSICAL REVIEW B, 1988, 38 (02) :1016-1026
[4]  
James R., 1958, OPTICAL PRINCIPLES D
[5]   THE EXTENDED X-RAY ABSORPTION FINE-STRUCTURE IN THE REFLECTIVITY AT THE K EDGE OF CU [J].
MARTENS, G ;
RABE, P .
JOURNAL OF PHYSICS C-SOLID STATE PHYSICS, 1981, 14 (10) :1523-1534
[6]  
Papoulis A., 1977, SIGNAL ANAL
[7]   A NEW METHOD TO EXTRACT THE X-RAY ABSORPTION FINE-STRUCTURES FROM THE REFLECTIVITY SPECTRA - APPLICATION TO THE STUDY OF (TI,NB)O2 AMORPHOUS SOLID-SOLUTIONS [J].
POUMELLEC, B ;
CORTES, R ;
LAGNEL, F ;
TOURILLON, G .
PHYSICA B, 1989, 158 (1-3) :282-283