SPECTRAL IRRADIANCE SCALES BASED ON FILTERED ABSOLUTE SILICON PHOTODETECTORS

被引：13
作者：
BRUENING, RJ
机构：
来源：
APPLIED OPTICS | 1987年 / 26卷 / 06期
关键词：
D O I：
10.1364/AO.26.001051
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
引用
收藏
页码：1051 / 1057
页数：7
相关论文
共 15 条
[1]   CALIBRATION OF INCANDESCENT LAMPS FOR SPECTRAL IRRADIANCE BY MEANS OF ABSOLUTE RADIOMETERS [J].
BOIVIN, LP .
APPLIED OPTICS, 1980, 19 (16) :2771-2780
[2]   ABSOLUTE SPECTRORADIOMETRIC AND PHOTOMETRIC SCALES BASED ON AN ELECTRICALLY CALIBRATED PYROELECTRIC RADIOMETER [J].
CARRERAS, C ;
CORRONS, A .
APPLIED OPTICS, 1981, 20 (07) :1174-1177
[3]  
ECKERLE KL, 1976, NBS US913 TECH NOT
[4]   COMPLETE COLLECTION OF MINORITY-CARRIERS FROM THE INVERSION LAYER IN INDUCED JUNCTION DIODES [J].
GEIST, J ;
LIANG, E ;
SCHAEFER, AR .
JOURNAL OF APPLIED PHYSICS, 1981, 52 (07) :4879-4881
[5]   QUANTUM EFFICIENCY OF THE P-N-JUNCTION IN SILICON AS AN ABSOLUTE RADIOMETRIC STANDARD [J].
GEIST, J .
APPLIED OPTICS, 1979, 18 (06) :760-762
[6]  
Giacomo P., 1980, METROLOGIA, V16, P55
[7]  
GILLHAM EJ, 1963, P ROY SOC LOND A MAT, V278, P137
[8]  
JENKINS FA, 1957, FUNDAMENTALS OPTICS, P20
[9]  
KORDE R, 1985, 1ST P PORTL INT C SI
[10]   THIN-FILM NARROW-BAND OPTICAL FILTERS [J].
MACLEOD, HA .
THIN SOLID FILMS, 1976, 34 (02) :335-342
12