SPECTRAL IRRADIANCE SCALES BASED ON FILTERED ABSOLUTE SILICON PHOTODETECTORS

[1] CALIBRATION OF INCANDESCENT LAMPS FOR SPECTRAL IRRADIANCE BY MEANS OF ABSOLUTE RADIOMETERS [J]. APPLIED OPTICS, 1980, 19 (16): : 2771 - 2780

[2] ABSOLUTE SPECTRORADIOMETRIC AND PHOTOMETRIC SCALES BASED ON AN ELECTRICALLY CALIBRATED PYROELECTRIC RADIOMETER [J]. APPLIED OPTICS, 1981, 20 (07): : 1174 - 1177

[3] ECKERLE KL, 1976, NBS US913 TECH NOT

[4] COMPLETE COLLECTION OF MINORITY-CARRIERS FROM THE INVERSION LAYER IN INDUCED JUNCTION DIODES [J]. JOURNAL OF APPLIED PHYSICS, 1981, 52 (07) : 4879 - 4881

[5] QUANTUM EFFICIENCY OF THE P-N-JUNCTION IN SILICON AS AN ABSOLUTE RADIOMETRIC STANDARD [J]. APPLIED OPTICS, 1979, 18 (06): : 760 - 762

[6] Giacomo P., 1980, METROLOGIA, V16, P55

[7] GILLHAM EJ, 1963, P ROY SOC LOND A MAT, V278, P137

[8] JENKINS FA, 1957, FUNDAMENTALS OPTICS, P20

[9] KORDE R, 1985, 1ST P PORTL INT C SI

[10] THIN-FILM NARROW-BAND OPTICAL FILTERS [J]. THIN SOLID FILMS, 1976, 34 (02) : 335 - 342

[1] CALIBRATION OF INCANDESCENT LAMPS FOR SPECTRAL IRRADIANCE BY MEANS OF ABSOLUTE RADIOMETERS [J]. APPLIED OPTICS, 1980, 19 (16): : 2771 - 2780

[2] ABSOLUTE SPECTRORADIOMETRIC AND PHOTOMETRIC SCALES BASED ON AN ELECTRICALLY CALIBRATED PYROELECTRIC RADIOMETER [J]. APPLIED OPTICS, 1981, 20 (07): : 1174 - 1177

[3] ECKERLE KL, 1976, NBS US913 TECH NOT

[4] COMPLETE COLLECTION OF MINORITY-CARRIERS FROM THE INVERSION LAYER IN INDUCED JUNCTION DIODES [J]. JOURNAL OF APPLIED PHYSICS, 1981, 52 (07) : 4879 - 4881

[5] QUANTUM EFFICIENCY OF THE P-N-JUNCTION IN SILICON AS AN ABSOLUTE RADIOMETRIC STANDARD [J]. APPLIED OPTICS, 1979, 18 (06): : 760 - 762

[6] Giacomo P., 1980, METROLOGIA, V16, P55

[7] GILLHAM EJ, 1963, P ROY SOC LOND A MAT, V278, P137

[8] JENKINS FA, 1957, FUNDAMENTALS OPTICS, P20

[9] KORDE R, 1985, 1ST P PORTL INT C SI

[10] THIN-FILM NARROW-BAND OPTICAL FILTERS [J]. THIN SOLID FILMS, 1976, 34 (02) : 335 - 342