X-RAY-FLUORESCENCE ESCAPE PEAKS IN HGI2 DETECTORS

被引：3
|
作者：
LIUXU, X
HEITZ, C
SIFFERT, P
REGAL, R
机构：
[1] CNRS, Labo. PHASE (UPR No. 292 du CNRS), Strasbourg, 67037
来源：
X-RAY SPECTROMETRY | 1994年 / 23卷 / 04期
关键词：
D O I：
10.1002/xrs.1300230408
中图分类号：
O433 [光谱学];
学科分类号：
0703 ; 070302 ;
摘要：
A mathematical model for the estimation of the relative intensities of the escape peaks in HgI2 detectors is presented. Comparison of calculated results with experimental values for various x-ray shows satisfactory agreement. The method can be used to evaluate directly the sensitive thickness of an HgI2 detector through the escape to total peak intensity ratio.
引用
收藏
页码：178 / 182
页数：5
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