ELECTRON-BEAM ANNEALING OF ION-IMPLANTED AL

被引:7
|
作者
WAMPLER, WR
FOLLSTAEDT, DM
PICRAUX, ST
机构
关键词
D O I
10.1063/1.91489
中图分类号
O59 [应用物理学];
学科分类号
摘要
引用
收藏
页码:366 / 368
页数:3
相关论文
共 50 条
  • [11] TEM STUDY OF ION-IMPLANTED GAAS AFTER PULSED ELECTRON-BEAM ANNEALING
    GAIGHER, HL
    ALBERTS, HW
    RADIATION EFFECTS AND DEFECTS IN SOLIDS, 1993, 125 (04): : 373 - 380
  • [12] HIGH-SPEED SCANNING ELECTRON-BEAM ANNEALING OF ION-IMPLANTED SILICON LAYERS
    SCHILLER, S
    PANZER, S
    KLABES, R
    THIN SOLID FILMS, 1980, 73 (01) : 221 - 226
  • [13] IMPURITY PROFILES AT MULTI-PULSE ELECTRON-BEAM ANNEALING OF ION-IMPLANTED SILICON
    DVURECHENSKII, AV
    GROTZSCHEL, R
    IGONINA, NM
    KASHNIKOV, BP
    KOMOLOVA, NI
    PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1982, 72 (01): : 301 - 304
  • [14] MELTING AND FREEZING KINETICS INDUCED BY PULSED ELECTRON-BEAM ANNEALING IN ION-IMPLANTED SILICON
    CHEMISKY, G
    BARBIER, D
    LAUGIER, A
    JOURNAL DE PHYSIQUE, 1983, 44 (NC-5): : 91 - 95
  • [15] A SELF-FOCUSED MULTICHANNEL ELECTRON-BEAM SOURCE FOR ANNEALING OF ION-IMPLANTED SEMICONDUCTORS
    LUE, JT
    SHYU, SY
    LYU, LH
    VACUUM, 1986, 36 (05) : 275 - 278
  • [16] KINETICS OF SCANNED ELECTRON-BEAM ANNEALING OF HIGH-ENERGY AS ION-IMPLANTED SILICON
    KRIMMEL, EF
    OPPOLZER, H
    RUNGE, H
    WONDRAK, W
    PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1981, 66 (02): : 565 - 571
  • [17] IN-SITU DETECTION OF REARRANGEMENT PROCESSES DURING ELECTRON-BEAM ANNEALING OF ION-IMPLANTED INP
    MAURER, C
    KALLWEIT, R
    BAUMANN, H
    BETHGE, K
    KRIMMEL, EF
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1993, 80-1 : 564 - 568
  • [18] PULSED-ELECTRON-BEAM ANNEALING OF ION-IMPLANTED GAAS
    ALBERTS, HW
    GAIGHER, HL
    FRIEDLAND, E
    MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY, 1991, 9 (1-3): : 331 - 335
  • [19] PULSE ELECTRON ANNEALING OF ION-IMPLANTED INP
    DAVIES, DE
    LORENZO, JP
    RYAN, TG
    FITZGERALD, JJ
    APPLIED PHYSICS LETTERS, 1979, 35 (08) : 631 - 633
  • [20] SURFACE-STRUCTURE STUDIES OF ELECTRON-BEAM ANNEALED ION-IMPLANTED SILICON
    MCMAHON, RA
    AHMED, H
    JOURNAL OF MICROSCOPY-OXFORD, 1980, 118 (JAN): : 61 - 66