X-RAY-DIFFRACTION STUDY OF THE STRUCTURE OF XENON MULTILAYERS ON SINGLE-CRYSTAL GRAPHITE

被引:14
|
作者
HONG, H [1 ]
BIRGENEAU, RJ [1 ]
机构
[1] MIT, DEPT PHYS, CAMBRIDGE, MA 02139 USA
来源
关键词
D O I
10.1007/BF01453791
中图分类号
O469 [凝聚态物理学];
学科分类号
070205 ;
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页码:413 / 419
页数:7
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