APPLICABILITY OF THE DIFFERENTIAL X-RAY ABSORPTION METHOD TO THE DETERMINATIONS OF FOIL THICKNESS AND LOCAL COMPOSITION IN THE ANALYTICAL ELECTRON-MICROSCOPE

被引：42
作者：
HORITA, Z
ICHITANI, K
SANO, T
NEMOTO, M
机构：
来源：
PHILOSOPHICAL MAGAZINE A-PHYSICS OF CONDENSED MATTER STRUCTURE DEFECTS AND MECHANICAL PROPERTIES | 1989年 / 59卷 / 05期
关键词：
D O I：
10.1080/01418618908209829
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
引用
收藏
页码：939 / 952
页数：14
相关论文
共 18 条
  • [1] BIRKS LS, 1981, HDB SPECTROSCOPY, P1
  • [2] CLIFF G, 1972, 5TH P EUR C EL MICR, P140
  • [3] Goldstein J.I., 1979, INTRO ANAL ELECT MIC, P83
  • [4] Goldstein JI, 1977, SCANNING ELECTRON MI, V1, P315
  • [5] Hirsch P., 1965, ELECT MICROSCOPY THI, P415
  • [6] SIMPLIFICATION OF X-RAY ABSORPTION CORRECTION IN THIN-SAMPLE QUANTITATIVE MICROANALYSIS
    HORITA, Z
    SANO, T
    NEMOTO, M
    [J]. ULTRAMICROSCOPY, 1987, 21 (03) : 271 - 276
  • [7] JACOBS MH, 1972, 5TH P EUR C EL MICR, P136
  • [8] DETERMINATION OF FOIL THICKNESS BY SCANNING-TRANSMISSION ELECTRON-MICROSCOPY
    KELLY, PM
    JOSTSONS, A
    BLAKE, RG
    NAPIER, JG
    [J]. PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1975, 31 (02): : 771 - 780
  • [9] CONTAMINATION FORMED AROUND A VERY NARROW ELECTRON-BEAM
    KNOX, WA
    [J]. ULTRAMICROSCOPY, 1976, 1 (03) : 175 - 180
  • [10] Lorimer G. W., 1976, DEV ELECT MICROSCOPY, P153
12