SECONDARY ION MASS-SPECTROMETRY (SIMS), A NEW METHOD FOR ANALYSIS OF SOLIDS

被引:0
作者
MAUL, J [1 ]
FLUCKIGER, U [1 ]
机构
[1] EIDGENOSS INST REAKTORFORSCH,CH-5303 WURENLINGEN,SWITZERLAND
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中图分类号
TL [原子能技术]; O571 [原子核物理学];
学科分类号
0827 ; 082701 ;
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页码:467 / 470
页数:4
相关论文
共 9 条
[1]   SURFACE INVESTIGATION OF SOLIDS BY STATICAL METHOD OF SECONDARY ION MASS SPECTROSCOPY (SIMS) [J].
BENNINGHOVEN, A .
SURFACE SCIENCE, 1973, 35 (01) :427-457
[2]  
FUCHS E, 1976, PHYSIK UNSERER ZEIT, V7, P136
[3]   ION SOURCE FOR MASS SPECTROGRAPHY [J].
HERZOG, RFK ;
VIEHBOCK, FP .
PHYSICAL REVIEW, 1949, 76 (06) :855-856
[4]  
JOHNSON CE, 1975, PHYSICAL ASPECT ELEC, P373
[5]  
RODER A, 1975, PROBL FESTKORPEREL, V7, P7
[6]  
Schulz F., 1973, Radiation Effects, V18, P211, DOI 10.1080/00337577308232124
[7]   SUCCESSFUL OPERATION OF A SCANNING ION-MICROSCOPE WITH QUADRUPOLE MASS FILTER [J].
WITTMAACK, K .
REVIEW OF SCIENTIFIC INSTRUMENTS, 1976, 47 (01) :157-158
[8]  
WITTMAACK K, 1977, TUSR23 REP, P95
[9]  
WITTMAACK K, COMMUNICATION