MEASUREMENT OF SURFACE PHOTOVOLTAGE IN HIGH-RATE DEPOSITED A-SI-H FILMS AND COMPARISON WITH PHOTOTHERMAL DEFLECTION SPECTROSCOPY AND CONDUCTIVITY DATA

被引：1

作者：

SCHWARZ, R ^{[1
]}

GOEDECKER, S ^{[1
]}

MUSCHIK, T ^{[1
]}

WYRSCH, N ^{[1
]}

SHAH, AV ^{[1
]}

CURTINS, H ^{[1
]}

机构：

[1] UNIV NEUCHATEL,INST MICROTECH,CH-2000 NEUCHATEL,SWITZERLAND

来源：

JOURNAL OF NON-CRYSTALLINE SOLIDS | 1987年 / 97-8卷

关键词：

D O I：

10.1016/0022-3093(87)90179-7

中图分类号：

TQ174 [陶瓷工业]; TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

引用

收藏

页码：759 / 762

页数：4

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