PHOTOMAGNETIC METHOD OF MEASURING THE LIFETIME ELECTRONS AND HOLES

被引：0

作者：

LANDSBERG, EG

机构：

来源：

INDUSTRIAL LABORATORY | 1961年 / 27卷 / 10期

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D O I：

暂无

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：1226 / 1230

页数：5

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[1] SEPARATE DETERMINATION OF LIFETIME FOR NONEQUILIBRIUM ELECTRONS AND HOLES IN SEMICONDUCTORS BY THE INTERFERENCE METHOD
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