SPECIAL ISSUE - SELECTED PAPERS FROM THE 1989 INTERNATIONAL TEST CONFERENCE

被引：0
作者：
RAJSKI, J [1 ]
SILBERMAN, GM [1 ]
机构：
[1] IBM CORP,THOMAS J WATSON RES CTR,VLSI ARCHITECTURES GRP,YORKTOWN HTS,NY 10598
来源：
IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS | 1992年 / 11卷 / 01期
关键词：
D O I：
暂无
中图分类号：
TP3 [计算技术、计算机技术];
学科分类号：
0812 ;
摘要：
引用
收藏
页码：2 / 3
页数：2
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