NIAL/N-GAAS SCHOTTKY DIODES - BARRIER HEIGHT ENHANCEMENT BY HIGH-TEMPERATURE ANNEALING

被引:49
作者
SANDS, T
CHAN, WK
CHANG, CC
CHASE, EW
KERAMIDAS, VG
机构
关键词
D O I
10.1063/1.99152
中图分类号
O59 [应用物理学];
学科分类号
摘要
引用
收藏
页码:1338 / 1340
页数:3
相关论文
共 50 条
  • [42] ELECTRON TRAPS CREATED BY HIGH-TEMPERATURE ANNEALING IN MBE N-GAAS
    DAY, DS
    OBERSTAR, JD
    DRUMMOND, TJ
    MORKOC, H
    CHO, AY
    STREETMAN, BG
    JOURNAL OF ELECTRONIC MATERIALS, 1981, 10 (03) : 445 - 453
  • [43] On the electrical characteristics of high energy carbon irradiated Au/n-GaAs Schottky Barrier Diodes
    Jayavel, P
    Santhakumar, K
    Ogura, M
    COMPOUND SEMICONDUCTORS 2001, 2002, (170): : 75 - 80
  • [44] CONTROL OF SCHOTTKY-BARRIER HEIGHT OF AG/MN/N-GAAS(110) DIODES WITH MN INTERLAYER THICKNESS
    SPALTMANN, D
    GEURTS, J
    ESSER, N
    ZAHN, DRT
    RICHTER, W
    WILLIAMS, RH
    SEMICONDUCTOR SCIENCE AND TECHNOLOGY, 1992, 7 (03) : 344 - 346
  • [45] SCHOTTKY-BARRIER ENHANCEMENT USING REACTED NI2AL3NI/N-GAAS, NI/AL/NI/N-GAAS, AND NIAL/AL/NI/N-GAAS CONTACTS
    CHEN, CP
    CHANG, YA
    KUECH, TF
    JOURNAL OF APPLIED PHYSICS, 1995, 77 (09) : 4777 - 4782
  • [46] Effect of barrier inhomogeneities on heavily doped Au/n-GaAs Schottky diodes
    Sharma, R
    Padha, N
    Krupanidhi, SB
    PROCEEDINGS OF THE ELEVENTH INTERNATIONAL WORKSHOP ON THE PHYSICS OF SEMICONDUCTOR DEVICES, VOL 1 & 2, 2002, 4746 : 931 - 935
  • [47] Determination of barrier height temperature coefficient by Norde's method in ideal Co/n-GaAs Schottky
    Turut, Abdulmecit
    TURKISH JOURNAL OF PHYSICS, 2012, 36 (02): : 235 - 244
  • [48] The effect of temperature on the electrical characteristics of Ti/n-GaAs Schottky diodes
    Durmus, Haziret
    Tataroglu, Adem
    Altindal, Semsettin
    Yildirim, Mert
    CURRENT APPLIED PHYSICS, 2022, 44 : 85 - 89
  • [49] Determination of the characteristic parameters of Sn/n-GaAs/Al-Ge Schottky diodes by a barrier height inhomogeneity model
    Dogan, H
    Yildirim, N
    Turut, A
    Biber, M
    Ayyildiz, E
    Nuhoglu, Ç
    SEMICONDUCTOR SCIENCE AND TECHNOLOGY, 2006, 21 (06) : 822 - 828
  • [50] SCHOTTKY-BARRIER DEGRADATION OF THE W/GAAS SYSTEM AFTER HIGH-TEMPERATURE ANNEALING
    YU, KM
    CHEUNG, SK
    SANDS, T
    JAKLEVIC, JM
    CHEUNG, NW
    HALLER, EE
    JOURNAL OF APPLIED PHYSICS, 1986, 60 (09) : 3235 - 3242