SURFACE-ROUGHNESS INDUCED SCATTERING AND BAND TAILING

被引:27
作者
GOODNICK, SM [1 ]
GANN, RG [1 ]
FERRY, DK [1 ]
WILMSEN, CW [1 ]
KRIVANEK, OL [1 ]
机构
[1] ARIZONA STATE UNIV,DEPT MAT SCI,TEMPE,AZ 85281
关键词
D O I
10.1016/0039-6028(82)90591-X
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
引用
收藏
页码:233 / 238
页数:6
相关论文
共 13 条
[2]   INVERSION LAYER TRANSPORT AND PROPERTIES OF OXIDES ON INAS [J].
BAGLEE, DA ;
FERRY, DK ;
WILMSEN, CW .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1980, 17 (05) :1032-1036
[3]  
Cheng Y. C., 1971, J JAPAN SOC APPL P S
[4]   CHARGE INSTABILITIES IN LATERAL SUPER-LATTICES UNDER CONDITIONS OF POPULATION-INVERSION [J].
FERRY, DK .
PHYSICA STATUS SOLIDI B-BASIC RESEARCH, 1981, 106 (01) :63-71
[5]  
FERRY DK, 1979, THIN SOLID FILMS, V56, P43
[6]   ELECTRON-SCATTERING IN SILICON INVERSION LAYERS BY OXIDE AND SURFACE-ROUGHNESS [J].
HARTSTEIN, A ;
NING, TH ;
FOWLER, AB .
SURFACE SCIENCE, 1976, 58 (01) :178-181
[7]   HIGH-TEMPERATURE VARIABLE RANGE HOPPING CONDUCTIVITY IN SILICON INVERSION LAYERS [J].
HARTSTEIN, A ;
FOWLER, AB .
JOURNAL OF PHYSICS C-SOLID STATE PHYSICS, 1975, 8 (11) :L249-L253
[8]   THE STRUCTURE OF ULTRATHIN OXIDE ON SILICON [J].
KRIVANEK, OL ;
MAZUR, JH .
APPLIED PHYSICS LETTERS, 1980, 37 (04) :392-394
[9]  
MANY A, 1965, SEMICONDUCTOR SURFAC, P305
[10]  
Matsumoto Y., 1974, JPN J APPL PHYS PT 2, V2-2, P367