TEMPERATURE DEPENDENCE OF GRAIN MIGRATION IN HIGH-PURITY LEAD CONTAINING SMALL ADDITIONS OF TIN

被引：0

作者：

AUST, KT

RUTTER, JW

机构：

来源：

TRANSACTIONS OF THE AMERICAN INSTITUTE OF MINING AND METALLURGICAL ENGINEERS | 1959年 / 215卷 / 05期

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中图分类号：

TU [建筑科学];

学科分类号：

0813 ;

摘要：

引用

页码：820 / 831

页数：12

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