ELECTRON-BEAM LITHOGRAPHY - ITS APPLICATIONS

被引:24
作者
HOHN, FJ
机构
来源
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | 1989年 / 7卷 / 06期
关键词
D O I
10.1116/1.584546
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
引用
收藏
页码:1405 / 1411
页数:7
相关论文
共 14 条
[1]  
BOERSCH H, 1959, NATURWISSENSCHAFTEN, V46, P596
[2]   INTEGRATED ELECTRON-BEAM LITHOGRAPHY FOR 0.25 MU-M DEVICE FABRICATION [J].
BUCCHIGNANO, J ;
ROSENFIELD, M ;
PEPPER, G ;
DAVARI, B ;
HOLM, F ;
VISWANATHAN, R .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1989, 7 (06) :1827-1831
[3]   SCANNING ELECTRON-BEAM LITHOGRAPHY FOR FABRICATION OF MAGNETIC-BUBBLE CIRCUITS [J].
CHANG, THP ;
HATZAKIS, M ;
WILSON, AD ;
SPETH, AJ ;
KERN, A ;
LUHN, H .
IBM JOURNAL OF RESEARCH AND DEVELOPMENT, 1976, 20 (04) :376-388
[4]   PROXIMITY EFFECT IN ELECTRON-BEAM LITHOGRAPHY [J].
CHANG, THP .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1975, 12 (06) :1271-1275
[5]  
COANE PJ, 1988, P MICROCIRCUIT ENG V
[6]  
GESLEY M, 1988, J VAC SCI TECHNOL B, V6
[7]   PRACTICAL ASPECTS OF MICROFABRICATION IN THE 100 NM REGIME [J].
KERN, DP ;
HOUZEGO, PJ ;
COANE, PJ ;
CHANG, THP .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1983, 1 (04) :1096-1100
[8]  
Molzen W. W., 1988, Proceedings of the SPIE - The International Society for Optical Engineering, V923, P132, DOI 10.1117/12.945642
[9]   HIGH-THROUGHPUT, HIGH-RESOLUTION ELECTRON-BEAM LITHOGRAPHY [J].
PFEIFFER, HC ;
GROVES, TR ;
NEWMAN, TH .
IBM JOURNAL OF RESEARCH AND DEVELOPMENT, 1988, 32 (04) :494-501
[10]   VARIABLE SPOT SHAPING FOR ELECTRON-BEAM LITHOGRAPHY [J].
PFEIFFER, HC .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1978, 15 (03) :887-890