ATOM PROBE FIELD-ION MICROSCOPY - IMAGING AT THE ATOMIC LEVEL

被引：0
|
作者：
MILLER, MK
BURKE, MG
机构：
[1] OAK RIDGE NATL LAB,DIV MET & CERAM,OAK RIDGE,TN 37831
[2] WESTINGHOUSE ELECT CORP,CTR RES & DEV,PITTSBURGH,PA 15235
来源：
JOURNAL OF METALS | 1988年 / 40卷 / 07期
关键词：
D O I：
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中图分类号：
TF [冶金工业];
学科分类号：
0806 ;
摘要：
引用
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页码：A40 / A40
页数：1
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