ATOM PROBE FIELD-ION MICROSCOPY - IMAGING AT THE ATOMIC LEVEL

被引：0

作者：

MILLER, MK

BURKE, MG

机构：

[1] OAK RIDGE NATL LAB,DIV MET & CERAM,OAK RIDGE,TN 37831

[2] WESTINGHOUSE ELECT CORP,CTR RES & DEV,PITTSBURGH,PA 15235

来源：

JOURNAL OF METALS | 1988年 / 40卷 / 07期

关键词：

D O I：

暂无

中图分类号：

TF [冶金工业];

学科分类号：

0806 ;

摘要：

引用

页码：A40 / A40

页数：1

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