MEASURING BULK CURRENTS ON SILICON RECTIFIERS AND A NEW METHOD OF ELIMINATING SURFACE EFFECT

被引：9
作者：
BURTSCHE.J
机构：
来源：
SOLID-STATE ELECTRONICS | 1969年 / 12卷 / 08期
关键词：
D O I：
10.1016/0038-1101(69)90033-1
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
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页码：591 / &
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