NOISE PROPERTIES OF ANALOG CORRELATORS WITH EXPONENTIALLY WEIGHTED AVERAGE

[1] Bendat J. S., 1971, RANDOM DATA ANAL MEA

[2] BENDAT JS, 1958, PRINCIPLES APPLICATI

[3] CURRENT TRANSIENT SPECTROSCOPY - A HIGH-SENSITIVITY DLTS SYSTEM [J]. IEEE TRANSACTIONS ON ELECTRON DEVICES, 1980, 27 (12) : 2217 - 2225

[4] TRANSIENT DISTORTION AND NTH ORDER FILTERING IN DEEP LEVEL TRANSIENT SPECTROSCOPY (DNLTS) [J]. SOLID-STATE ELECTRONICS, 1981, 24 (01) : 25 - 36

[5] DEEP-LEVEL-TRANSIENT SPECTROSCOPY - SYSTEM EFFECTS AND DATA-ANALYSIS [J]. JOURNAL OF APPLIED PHYSICS, 1979, 50 (08) : 5093 - 5098

[6] THEORETICAL SIGNAL-TO-NOISE RATIO FOR CORRELATORS WITH LINEAR AVERAGING [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1987, 58 (01) : 75 - 77

[7] DMOWSKI K, 1985, 3RD INT WORKSH PHYS, P147

[8] DMOWSKI K, 1986, P INT AMSE C MODELLI, V1, P49

[9] FISHER JC, TEK TALK, V6

[10] OPTIMUM CORRELATION METHOD FOR MEASUREMENT OF NOISY TRANSIENTS IN SOLID-STATE PHYSICS EXPERIMENTS [J]. ELECTRONICS LETTERS, 1978, 14 (13) : 388 - 390

[1] Bendat J. S., 1971, RANDOM DATA ANAL MEA

[2] BENDAT JS, 1958, PRINCIPLES APPLICATI

[3] CURRENT TRANSIENT SPECTROSCOPY - A HIGH-SENSITIVITY DLTS SYSTEM [J]. IEEE TRANSACTIONS ON ELECTRON DEVICES, 1980, 27 (12) : 2217 - 2225

[4] TRANSIENT DISTORTION AND NTH ORDER FILTERING IN DEEP LEVEL TRANSIENT SPECTROSCOPY (DNLTS) [J]. SOLID-STATE ELECTRONICS, 1981, 24 (01) : 25 - 36

[5] DEEP-LEVEL-TRANSIENT SPECTROSCOPY - SYSTEM EFFECTS AND DATA-ANALYSIS [J]. JOURNAL OF APPLIED PHYSICS, 1979, 50 (08) : 5093 - 5098

[6] THEORETICAL SIGNAL-TO-NOISE RATIO FOR CORRELATORS WITH LINEAR AVERAGING [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1987, 58 (01) : 75 - 77

[7] DMOWSKI K, 1985, 3RD INT WORKSH PHYS, P147

[8] DMOWSKI K, 1986, P INT AMSE C MODELLI, V1, P49

[9] FISHER JC, TEK TALK, V6

[10] OPTIMUM CORRELATION METHOD FOR MEASUREMENT OF NOISY TRANSIENTS IN SOLID-STATE PHYSICS EXPERIMENTS [J]. ELECTRONICS LETTERS, 1978, 14 (13) : 388 - 390