APPLICATION OF DIFFERENTIAL ANOMALOUS X-RAY-SCATTERING TO STRUCTURAL STUDIES OF AMORPHOUS MATERIALS

被引：285
作者：
FUOSS, PH [1 ]
EISENBERGER, P [1 ]
WARBURTON, WK [1 ]
BIENENSTOCK, A [1 ]
机构：
[1] STANFORD UNIV,DEPT MAT SCI,STANFORD,CA 94305
来源：
PHYSICAL REVIEW LETTERS | 1981年 / 46卷 / 23期
关键词：
D O I：
10.1103/PhysRevLett.46.1537
中图分类号：
O4 [物理学];
学科分类号：
0702 ;
摘要：
引用
收藏
页码：1537 / 1540
页数：4
相关论文
共 9 条
[1]  
[Anonymous], [No title captured]
[2]   OPTICAL-SPECTRA AND ELECTRONIC-STRUCTURE OF CRYSTALLINE AND GLASSY GE(S,SE)2 [J].
ASPNES, DE ;
PHILLIPS, JC ;
TAI, KL ;
BRIDENBAUGH, PM .
PHYSICAL REVIEW B, 1981, 23 (02) :816-822
[3]  
Bienenstock A., 1973, Journal of Non-Crystalline Solids, V11, P447, DOI 10.1016/0022-3093(73)90090-2
[4]  
FUOSS P, 1980, THESIS STANFORD U
[5]  
FUOSS PH, 1980, 8006 STANF SYNCHR RA
[6]   FREQUENCY MODULATED X-RAY-DIFFRACTION .1. DETERMINATION OF PARTIAL STRUCTURE FACTORS [J].
SHEVCHIK, NJ .
PHILOSOPHICAL MAGAZINE, 1977, 35 (03) :805-809
[7]   FREQUENCY MODULATED X-RAY-DIFFRACTION .2. STRUCTURES OF MULTI-ELEMENT DISORDERED SYSTEMS [J].
SHEVCHIK, NJ .
PHILOSOPHICAL MAGAZINE, 1977, 35 (05) :1289-1298
[8]  
WARREN BE, 1969, XRAY DIFFRACTION, pCH10
[9]  
ZACHARIASEN WH, 1936, PHYS REV, V49, P884
1