共 21 条
[12]
CAF2/SI(111) - THIN-FILM CHARACTERIZATION BY HIGH-RESOLUTION ELECTRON-ENERGY-LOSS SPECTROSCOPY
[J].
PHYSICAL REVIEW B,
1986, 34 (10)
:7471-7474
[13]
INITIAL FORMATION OF THE INTERFACE BETWEEN A POLAR INSULATOR AND A NONPOLAR SEMICONDUCTOR - CAF2 ON SI(111)
[J].
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B,
1986, 4 (04)
:1123-1127
[14]
Onoda H., 1985, International Electron Devices Meeting. Technical Digest (Cat. No. 85CH2252-5), P680
[15]
ELECTRONIC-STRUCTURE OF THE CAF2/SI(111) INTERFACE
[J].
PHYSICAL REVIEW B,
1986, 34 (10)
:7295-7306
[16]
EPITAXIAL-GROWTH OF CAF2 ON GAAS(100)
[J].
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS,
1985, 3 (03)
:842-845
[19]
GROWTH OF SEMICONDUCTOR INSULATOR STRUCTURES - GAAS/FLUORIDE/GAAS (001)
[J].
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B,
1985, 3 (02)
:500-507