X-RAY-DIFFRACTION PROFILE STUDY IN SILVER FILMS VAPOR-DEPOSITED ON A ROTATING SUBSTRATE WITH AXIAL CENTER AT 44 DEGREES TO VAPOR DIRECTION

被引：7

作者：

SEN, S ^{[1
]}

HALDER, SK ^{[1
]}

GUPTA, SPS ^{[1
]}

机构：

[1] INDIAN ASSOC CULTIVAT SCI,DEPT GEN PHYS & XRAYS,CALCUTTA 700032,INDIA

来源：

JOURNAL OF PHYSICS D-APPLIED PHYSICS | 1977年 / 10卷 / 10期

关键词：

D O I：

10.1088/0022-3727/10/10/004

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：L139 / L142

页数：4

共 50 条

[1] X-RAY-DIFFRACTION STUDY OF THE AMORPHOUS STRUCTURE OF CHEMICALLY VAPOR-DEPOSITED SILICON-NITRIDE
AIYAMA, T
FUKUNAGA, T
NIIHARA, K
HIRAI, T
SUZUKI, K
JOURNAL OF NON-CRYSTALLINE SOLIDS, 1979, 33 (02) : 131 - 139
[2] HIGH-TEMPERATURE X-RAY-DIFFRACTION STUDIES ON PHYSICAL VAPOR-DEPOSITED TIN
RICKERBY, DS
BULL, SJ
JONES, AM
CULLEN, FL
BELLAMY, BA
SURFACE & COATINGS TECHNOLOGY, 1989, 39 (1-3): : 397 - 408
[3] X-RAY-REFLECTIVITY STUDY OF THE GROWTH-KINETICS OF VAPOR-DEPOSITED SILVER FILMS
THOMPSON, C
PALASANTZAS, G
FENG, YP
SINHA, SK
KRIM, J
PHYSICAL REVIEW B, 1994, 49 (07): : 4902 - 4907
[4] KINETICS AND CRYSTALLIZATION STUDIES BY INSITU X-RAY-DIFFRACTION OF THE OXIDATION OF CHEMICALLY VAPOR-DEPOSITED SIC
SIBIEUDE, F
RODRIGUEZ, J
CLAVAGUERAMORA, MT
THIN SOLID FILMS, 1991, 204 (01) : 217 - 227
[5] TRANSIENT SOLID-PHASE CRYSTALLIZATION STUDY OF CHEMICALLY VAPOR-DEPOSITED AMORPHOUS-SILICON FILMS BY INSITU X-RAY-DIFFRACTION
BISARO, R
MAGARINO, J
PASTOL, Y
GERMAIN, P
ZELLAMA, K
PHYSICAL REVIEW B, 1989, 40 (11): : 7655 - 7662
[6] X-RAY-DIFFRACTION STUDY ON LATTICE IMPERFECTIONS IN VAPOR-DEPOSITED FCC (AG-4.5 AT-PERCENT GE) ALLOY-FILMS
SEN, S
SENGUPTA, SP
JOURNAL OF PHYSICS D-APPLIED PHYSICS, 1978, 11 (11) : 1529 - 1534
[7] Comparison study of physical vapor-deposited and chemical vapor-deposited titanium nitride thin films using X-ray photoelectron spectroscopy
Zhao, J
Garza, EG
Lam, K
Jones, CM
APPLIED SURFACE SCIENCE, 2000, 158 (3-4) : 246 - 251
[8] X-RAY DIFFRACTION STUDY ON THE MICROSTRUCTURE OF VAPOR-DEPOSITED FCC LEAD FILMS: NORMAL AND OBLIQUE INCIDENCES.
Nandi, R.K.
Sen Gupta, S.P.
Journal of Applied Physics, 1979, 50 (10): : 6262 - 6266
[9] AN X-RAY TENSOMETER STUDY OF ELASTIC ANISOTROPY OF CRYSTALS IN POLYCRYSTALLINE VAPOR-DEPOSITED FILMS
FUKS, MY
PALATNIK, LS
ILINSKII, AI
BELOZERO.VV
SOVIET PHYSICS SOLID STATE,USSR, 1967, 9 (03): : 588 - &
[10] X-RAY-DIFFRACTION STUDY AND ELECTRICAL CHARACTERIZATION OF BORON-IMPLANTED LOW-PRESSURE CHEMICAL VAPOR-DEPOSITED POLYCRYSTALLINE SILICON LAYERS
HENDRIKS, M
DELHEZ, R
DEKEIJSER, TH
RADELAAR, S
HABRAKEN, FHPM
KUIPER, AET
BOUDEWIJN, PR
JOURNAL OF APPLIED PHYSICS, 1984, 56 (10) : 2751 - 2761

← 1 2 3 4 5 →