PULSED-LASER DEPOSITION OF C-60 THIN-FILMS WITH ATOMICALLY SMOOTH SURFACE

被引:13
|
作者
YOSHIMOTO, M [1 ]
ARAKANE, T [1 ]
ASAKAWA, T [1 ]
HORIGUCHI, K [1 ]
HIRAI, K [1 ]
KOINUMA, H [1 ]
机构
[1] KANAGAWA HIGH TECHNOL FDN, MAT CHARACTERIZAT LAB, TAKATSU KU, KAWASAKI 213, JAPAN
关键词
PULSED LASER DEPOSITION; KRF EXCIMER LASER; C-60 FULLERENE THIN FILM; ATOMICALLY SMOOTH SURFACE; ATOMIC FORCE MICROSCOPY;
D O I
10.1143/JJAP.32.L1081
中图分类号
O59 [应用物理学];
学科分类号
摘要
Pulsed laser deposition was found to be a novel method for the fabrication of high-quality C60 thin films with extremely smooth surfaces. The irradiation of a pulsed KrF excimer laser beam onto a C60 powder target induced the formation of a plasma plume when the laser energy fluence was 40 mJ/cm2 and higher. The ablated species were condensed onto a substrate in the form of thin film. Thin films deposited at laser energy fluences in the narrow range between 40 MJ/cm2 and 50 MJ/cm2 were confirmed to have a single phase Of C60 solid from the Raman scattering and optical absorption spectra as well as from the chromatography of benzene extract of the films. With increase of the laser energy fluence over 50 MJ/cm2, the deposited films included increasing amounts of photodecomposed components and, consequently, varying physical properties. Atomic force microscopy revealed atomically smooth surfaces of C60 thin films laser-deposited at laser energy fluences between 40 MJ/cm2 and 50 MJ/cm2.
引用
收藏
页码:L1081 / L1084
页数:4
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