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DETERMINATION OF OXYGEN IN SEMICONDUCTOR MATERIALS WITH A CRYOGENICALLY PUMPED SPARK-SOURCE MASS-SPECTROMETER
被引:16
作者
:
CLEGG, JB
论文数:
0
引用数:
0
h-index:
0
机构:
MULLARD RES LABS,REDHILL,SURREY,ENGLAND
MULLARD RES LABS,REDHILL,SURREY,ENGLAND
CLEGG, JB
[
1
]
GALE, IG
论文数:
0
引用数:
0
h-index:
0
机构:
MULLARD RES LABS,REDHILL,SURREY,ENGLAND
MULLARD RES LABS,REDHILL,SURREY,ENGLAND
GALE, IG
[
1
]
MILLETT, EJ
论文数:
0
引用数:
0
h-index:
0
机构:
MULLARD RES LABS,REDHILL,SURREY,ENGLAND
MULLARD RES LABS,REDHILL,SURREY,ENGLAND
MILLETT, EJ
[
1
]
机构
:
[1]
MULLARD RES LABS,REDHILL,SURREY,ENGLAND
来源
:
ANALYST
|
1973年
/ 98卷
/ 1162期
关键词
:
D O I
:
10.1039/an9739800069
中图分类号
:
O65 [分析化学];
学科分类号
:
070302 ;
081704 ;
摘要
:
引用
收藏
页码:69 / 74
页数:6
相关论文
共 23 条
[1]
DETERMINATION OF OXYGEN IN GALLIUM ARSENIDE BY NEUTRON ACTIVATION ANALYSIS
BAILEY, RF
论文数:
0
引用数:
0
h-index:
0
BAILEY, RF
ROSS, DA
论文数:
0
引用数:
0
h-index:
0
ROSS, DA
[J].
ANALYTICAL CHEMISTRY,
1963,
35
(07)
: 791
-
&
[2]
DETERMINATION OF PARTS PER BILLION OF OXYGEN IN SILICON
BAKER, JA
论文数:
0
引用数:
0
h-index:
0
BAKER, JA
[J].
SOLID-STATE ELECTRONICS,
1970,
13
(11)
: 1431
-
&
[3]
ELECTRON MICROSCOPIC OBSERVATIONS OF SIO2 PRECIPITATES AT DISLOCATIONS IN SILICON
BIALAS, D
论文数:
0
引用数:
0
h-index:
0
机构:
Forschungsinstitut, AEG-Telefunken, Frankfurt am Main
BIALAS, D
HESSE, J
论文数:
0
引用数:
0
h-index:
0
机构:
Forschungsinstitut, AEG-Telefunken, Frankfurt am Main
HESSE, J
[J].
JOURNAL OF MATERIALS SCIENCE,
1969,
4
(09)
: 779
-
&
[4]
CLEGG JB, 1968, 8 P ANN AEI MS7 US C
[5]
ETCH PITS IN GERMANIUM AND THEIR RELATION TO HARDNESS
DALE, JR
论文数:
0
引用数:
0
h-index:
0
DALE, JR
BRICE, JC
论文数:
0
引用数:
0
h-index:
0
BRICE, JC
[J].
SOLID-STATE ELECTRONICS,
1961,
3
(02)
: 105
-
&
[6]
DEGREVE F, 1970, INT C MASS SPECTROME
[7]
DESJARDINS M, 1967, INT C MASS SPECTROME
[8]
ENGELMANN C, 1967, R3307 CEA RAPP
[9]
MICRODETERMINATION OF OXYGEN CARBON AND WATER IN INORGANIC MATERIALS USING A CARRIER-GAS TECHNIQUE
ENGELSMAN, J
论文数:
0
引用数:
0
h-index:
0
ENGELSMAN, J
MEYER, A
论文数:
0
引用数:
0
h-index:
0
MEYER, A
VISSER, J
论文数:
0
引用数:
0
h-index:
0
VISSER, J
[J].
TALANTA,
1966,
13
(03)
: 409
-
+
[10]
QUANTITATIVE SPARK SOURCE MASS SPECTROMETRY USING CRYOSORPTION PUMPING
HARRINGTON, WL
论文数:
0
引用数:
0
h-index:
0
HARRINGTON, WL
SKOGERBOE, RK
论文数:
0
引用数:
0
h-index:
0
SKOGERBOE, RK
MORRISON, GH
论文数:
0
引用数:
0
h-index:
0
MORRISON, GH
[J].
ANALYTICAL CHEMISTRY,
1965,
37
(12)
: 1480
-
+
←
1
2
3
→
共 23 条
[1]
DETERMINATION OF OXYGEN IN GALLIUM ARSENIDE BY NEUTRON ACTIVATION ANALYSIS
BAILEY, RF
论文数:
0
引用数:
0
h-index:
0
BAILEY, RF
ROSS, DA
论文数:
0
引用数:
0
h-index:
0
ROSS, DA
[J].
ANALYTICAL CHEMISTRY,
1963,
35
(07)
: 791
-
&
[2]
DETERMINATION OF PARTS PER BILLION OF OXYGEN IN SILICON
BAKER, JA
论文数:
0
引用数:
0
h-index:
0
BAKER, JA
[J].
SOLID-STATE ELECTRONICS,
1970,
13
(11)
: 1431
-
&
[3]
ELECTRON MICROSCOPIC OBSERVATIONS OF SIO2 PRECIPITATES AT DISLOCATIONS IN SILICON
BIALAS, D
论文数:
0
引用数:
0
h-index:
0
机构:
Forschungsinstitut, AEG-Telefunken, Frankfurt am Main
BIALAS, D
HESSE, J
论文数:
0
引用数:
0
h-index:
0
机构:
Forschungsinstitut, AEG-Telefunken, Frankfurt am Main
HESSE, J
[J].
JOURNAL OF MATERIALS SCIENCE,
1969,
4
(09)
: 779
-
&
[4]
CLEGG JB, 1968, 8 P ANN AEI MS7 US C
[5]
ETCH PITS IN GERMANIUM AND THEIR RELATION TO HARDNESS
DALE, JR
论文数:
0
引用数:
0
h-index:
0
DALE, JR
BRICE, JC
论文数:
0
引用数:
0
h-index:
0
BRICE, JC
[J].
SOLID-STATE ELECTRONICS,
1961,
3
(02)
: 105
-
&
[6]
DEGREVE F, 1970, INT C MASS SPECTROME
[7]
DESJARDINS M, 1967, INT C MASS SPECTROME
[8]
ENGELMANN C, 1967, R3307 CEA RAPP
[9]
MICRODETERMINATION OF OXYGEN CARBON AND WATER IN INORGANIC MATERIALS USING A CARRIER-GAS TECHNIQUE
ENGELSMAN, J
论文数:
0
引用数:
0
h-index:
0
ENGELSMAN, J
MEYER, A
论文数:
0
引用数:
0
h-index:
0
MEYER, A
VISSER, J
论文数:
0
引用数:
0
h-index:
0
VISSER, J
[J].
TALANTA,
1966,
13
(03)
: 409
-
+
[10]
QUANTITATIVE SPARK SOURCE MASS SPECTROMETRY USING CRYOSORPTION PUMPING
HARRINGTON, WL
论文数:
0
引用数:
0
h-index:
0
HARRINGTON, WL
SKOGERBOE, RK
论文数:
0
引用数:
0
h-index:
0
SKOGERBOE, RK
MORRISON, GH
论文数:
0
引用数:
0
h-index:
0
MORRISON, GH
[J].
ANALYTICAL CHEMISTRY,
1965,
37
(12)
: 1480
-
+
←
1
2
3
→