THE THERMAL EXPANSION OF ALUMINIUM AT LOW TEMPERATURES AS MEASURED BY AN X-RAY DIFFRACTION METHOD

被引：67
|
作者：
FIGGINS, BF
JONES, GO
RILEY, DP
机构：
来源：
PHILOSOPHICAL MAGAZINE | 1956年 / 1卷 / 08期
关键词：
D O I：
10.1080/14786435608238150
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
引用
收藏
页码：747 / 758
页数：12
相关论文
共 50 条
  • [31] X-ray diffraction study of MgB2 at low temperatures
    Xue, Y
    Asada, S
    Hosomichi, A
    Naher, S
    Xue, J
    Kaneko, H
    Suzuki, H
    Muranaka, T
    Akimitsu, J
    JOURNAL OF LOW TEMPERATURE PHYSICS, 2005, 138 (5-6) : 1105 - 1115
  • [32] High-resolution X-ray diffraction of silicon at low temperatures
    Lu, Z
    Munakata, K
    Kohno, A
    Soejima, Y
    Okazaki, A
    NUOVO CIMENTO DELLA SOCIETA ITALIANA DI FISICA D-CONDENSED MATTER ATOMIC MOLECULAR AND CHEMICAL PHYSICS FLUIDS PLASMAS BIOPHYSICS, 1997, 19 (2-4): : 305 - 311
  • [33] A NEW METHOD FOR MEASURING THE THERMAL EXPANSION OF SOLIDS AT LOW TEMPERATURES - THE THERMAL EXPANSION OF COPPER AND ALUMINIUM AND THE GRUNEISEN RULE
    BIJL, D
    PULLAN, H
    PHYSICA, 1955, 21 (04): : 285 - 298
  • [34] On characterization of microstress measured by X-ray diffraction
    Zhang, Dingquan
    He, Jiawen
    Jinshu Xuebao/Acta Metallurgica Sinica, 1998, 34 (12): : 1273 - 1278
  • [35] X-ray diffraction in thermal treatments: Determination of residual austenite by X-ray diffraction
    Bach, M
    Broll, N
    Cornet, A
    Gaide, L
    JOURNAL DE PHYSIQUE IV, 1996, 6 (C4): : 887 - 895
  • [36] X-RAY DIFFRACTION BY LIQUIDS AT DIFFERENT TEMPERATURES
    VENKATESAN, K
    PILLAI, SP
    ZEITSCHRIFT FUR NATURFORSCHUNG PART B-CHEMIE BIOCHEMIE BIOPHYSIK BIOLOGIE UND VERWANDTEN GEBIETE, 1961, B 16 (03): : 223 - &
  • [37] Structure and thermal expansion of (Crx,V1-x)n+1AlCn phases measured by X-ray diffraction
    Halim, Joseph
    Chartier, Patrick
    Basyuk, Tatyana
    Prikhna, Tatyana
    Caspi, El'ad N.
    Barsoum, Michel W.
    Cabioc'h, Thierry
    JOURNAL OF THE EUROPEAN CERAMIC SOCIETY, 2017, 37 (01) : 15 - 21
  • [38] Thermal mismatch stress in SiC whisker reinforced aluminium composite: new measurement method by X-ray diffraction
    Fei, WD
    Liu, QY
    Liang, NG
    Yao, CK
    MATERIALS SCIENCE AND TECHNOLOGY, 2001, 17 (08) : 912 - 916
  • [39] DETERMINATION OF THERMAL-EXPANSION COEFFICIENT OF SILICON BY X-RAY DOUBLE DIFFRACTION
    BLET, G
    COMPTES RENDUS HEBDOMADAIRES DES SEANCES DE L ACADEMIE DES SCIENCES SERIE B, 1975, 281 (10): : 137 - 139
  • [40] DEBYE TEMPERATURE AND COEFFICIENT OF THERMAL EXPANSION FOR V AND NB BY X-RAY DIFFRACTION
    LINKOAHO, M
    RANTAVUO.E
    PHYSICA STATUS SOLIDI, 1970, 37 (02): : K89 - &
12345