LIMITING THICKNESS HEPI FOR EPITAXIAL-GROWTH AND ROOM-TEMPERATURE SI GROWTH ON SI(100)

被引:303
作者
EAGLESHAM, DJ
GOSSMANN, HJ
CERULLO, M
机构
关键词
D O I
10.1103/PhysRevLett.65.1227
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
Si molecular-beam epitaxy (MBE) on smooth Si(100) surfaces is shown to occur at room temperature. We demonstrate for the first time that Si deposition becomes amorphous after growth of a limiting epitaxial thickness (hepi). hepi is 1030 at room temperature and increases rapidly at higher temperatures with a rate-dependent activation energy in the range 0.41.5 eV. The effect is tentatively linked to surface roughening during growth at low temperatures, and is probably general in MBE, also occurring for Si/Si(111), Ge/Si(100, and GaAs/GaAs(100). © 1990 The American Physical Society.
引用
收藏
页码:1227 / 1230
页数:4
相关论文
共 21 条
[1]   MONOLAYER AND BILAYER GROWTH ON GE(111) AND SI(111) [J].
AARTS, J ;
LARSEN, PK .
SURFACE SCIENCE, 1987, 188 (03) :391-401
[2]  
AARTS J, 1986, APPL PHYS LETT, V48, P931, DOI 10.1063/1.96662
[3]  
AARTS J, 1988, RHEED REFLECTION ELE, P449
[4]   SI MOLECULAR-BEAM EPITAXY - A MODEL FOR TEMPERATURE-DEPENDENT INCORPORATION PROBABILITIES AND DEPTH DISTRIBUTIONS OF DOPANTS EXHIBITING STRONG SURFACE SEGREGATION [J].
BARNETT, SA ;
GREENE, JE .
SURFACE SCIENCE, 1985, 151 (01) :67-90
[5]   ARBITRARY DOPING PROFILES PRODUCED BY SB-DOPED SI MBE [J].
BEAN, JC .
APPLIED PHYSICS LETTERS, 1978, 33 (07) :654-656
[6]  
EAGLESHAM DJ, IN PRESS
[7]  
GOSSMANN HH, IN PRESS
[8]   MOLECULAR-BEAM EPITAXY AND RECONSTRUCTED SURFACES - INITIAL-STAGES OF INTERFACE FORMATION IN GROUP IV-IV STRUCTURES [J].
GOSSMANN, HJ ;
FELDMAN, LC .
APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 1985, 38 (03) :171-179
[9]   ION-NEUTRALIZATION SPECTROSCOPY OF SOLIDS AND SOLID SURFACES [J].
HAGSTRUM, HD .
PHYSICAL REVIEW, 1966, 150 (02) :495-+
[10]  
HEADRICK RL, IN PRESS