QUANTITATIVE ANALYSIS WITH THE X-RAY SPECTROMETER - ACCURACY AND REPRODUCIBILITY

被引:22
作者
KLUG, HP
ALEXANDER, L
KUMMER, E
机构
关键词
D O I
10.1021/ac60019a003
中图分类号
O65 [分析化学];
学科分类号
070302 ; 081704 ;
摘要
引用
收藏
页码:607 / 609
页数:3
相关论文
共 5 条
  • [1] Quantitative analysis of mine dusts - An x-ray diffraction method
    Clark, GL
    Reynolds, DH
    [J]. INDUSTRIAL AND ENGINEERING CHEMISTRY-ANALYTICAL EDITION, 1936, 8 : 36 - 40
  • [2] FRIEDMAN H, 1945, ELECTRONICS, V18, P132
  • [3] Chemical analysis by x-ray diffraction - Classification and use of x-ray diffraction patterns
    Hanawalt, JD
    Rinn, HW
    Frevel, LK
    [J]. INDUSTRIAL AND ENGINEERING CHEMISTRY-ANALYTICAL EDITION, 1938, 10 : 0457 - 0512
  • [4] A new method of chemical analysis
    Hull, AW
    [J]. JOURNAL OF THE AMERICAN CHEMICAL SOCIETY, 1919, 41 : 1168 - 1175
  • [5] KLUG HP, IN PRESS J IND HYG T