HIGH-RESOLUTION STUDIES IN DECAY OF 133BA WITH SEMICONDUCTOR COUNTERS

被引：33
|
作者：
BOSCH, HE
HAVERFIELD, AJ
SZICHMAN, E
ABECASIS, SM
机构：
来源：
NUCLEAR PHYSICS A | 1968年 / A108卷 / 01期
关键词：
D O I：
10.1016/0375-9474(68)90154-1
中图分类号：
O57 [原子核物理学、高能物理学];
学科分类号：
070202 ;
摘要：
引用
收藏
页码：209 / +
页数：1
相关论文
共 50 条
  • [31] HIGH-RESOLUTION LITHOGRAPHY ON ACTIVE SEMICONDUCTOR MEMBRANES
    MACKIE, S
    BEAUMONT, SP
    WILKINSON, CDW
    JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1982, 129 (03) : C112 - C112
  • [32] HIGH-RESOLUTION STUDIES OF THE ELECTRONIC DECAY OF CORE HOLES IN MOLECULES - THERE IS NO THRESHOLD AT THE XPS THRESHOLD
    NEEB, M
    BIERMANN, M
    EBERHARDT, W
    JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 1994, 69 (03) : 239 - 244
  • [33] HIGH-RESOLUTION MULTIWIRE PROPORTIONAL COUNTERS USING HELICALLY WOUND CATHODES
    LEE, DM
    SOBOTTKA, SE
    THIESSEN, HA
    BULLETIN OF THE AMERICAN PHYSICAL SOCIETY, 1973, 18 (04): : 617 - 617
  • [34] Isotherm, Kinetic, and Selectivity Studies for the Removal of 133Ba and 137Cs from Aqueous Solution Using Turkish Perlite
    Inan, Suleyman
    Kusumkar, Vipul Vilas
    Galambos, Michal
    Viglasova, Eva
    Rosskopfova, Ol'ga
    Dano, Martin
    MATERIALS, 2022, 15 (21)
  • [35] X-ray high-resolution diffractometry for studies of diffuse scattering in semiconductor materials
    Gronkowski, J
    Borowski, J
    CRYSTAL RESEARCH AND TECHNOLOGY, 2001, 36 (8-10) : 815 - 824
  • [36] HIGH-RESOLUTION LASER SPECTROSCOPY OF BA RYDBERG ATOMS
    RINNEBERG, H
    NEUKAMMER, J
    KONIG, A
    VIETZKE, K
    HIERONYMUS, H
    KOHL, M
    GRABKA, HJ
    JONSSON, G
    HYPERFINE INTERACTIONS, 1987, 38 (1-4): : 515 - 530
  • [37] HIGH-RESOLUTION INFRARED SPECTROSCOPY WITH TUNABLE SEMICONDUCTOR LASERS
    NILL, KW
    BULLETIN OF THE AMERICAN PHYSICAL SOCIETY, 1973, 18 (01): : 11 - 11
  • [38] High-resolution calorimetry: limitations of doped semiconductor thermometers
    McCammon, D
    Almy, R
    Apodaca, E
    Deiker, S
    Galeazzi, M
    Han, SI
    Lesser, A
    Sanders, W
    Kelley, RL
    Moseley, SH
    Porter, FS
    Stahle, CK
    Szymkowiak, AE
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 1999, 436 (1-2): : 205 - 211
  • [39] Selective high-resolution electrodeposition on semiconductor defect patterns
    Schmuki, P
    Erickson, LE
    PHYSICAL REVIEW LETTERS, 2000, 85 (14) : 2985 - 2988
  • [40] HIGH-RESOLUTION ELECTRON-MICROSCOPY OF SEMICONDUCTOR INTERFACES
    GUTAKOVSKII, AK
    FEDINA, LI
    ASEEV, AL
    PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1995, 150 (01): : 127 - 140
12345