INVESTIGATION OF FILM-THICKNESS DETERMINATION BY OSCILLATING QUARTZ RESONATORS WITH LARGE MASS LOAD

被引:336
作者
LU, CS
LEWIS, O
机构
关键词
D O I
10.1063/1.1660931
中图分类号
O59 [应用物理学];
学科分类号
摘要
引用
收藏
页码:4385 / &
相关论文
共 10 条
[1]   LONG-TERM OPERATION OF CRYSTAL OSCILLATORS IN THIN-FILM DEPOSITION [J].
BEHRNDT, KH .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1971, 8 (05) :622-&
[2]  
EERNISSE EP, 1967, IEEE T SON ULTRASON, V14, P59
[3]   SENSITIVITY ENHANCEMENT BY USE OF ACOUSTIC RESONATORS IN CW ULTRASONIC SPECTROSCOPY [J].
MILLER, JG ;
BOLEF, DI .
JOURNAL OF APPLIED PHYSICS, 1968, 39 (10) :4589-&
[4]   ACOUSTIC WAVE ANALYSIS OF OPERATION OF QUARTZ-CRYSTAL FILM-THICKNESS MONITORS [J].
MILLER, JG ;
BOLEF, DI .
JOURNAL OF APPLIED PHYSICS, 1968, 39 (12) :5815-&
[5]   DIRECT GRAVIMETRIC CALIBRATION OF A QUARTZ CRYSTAL MICROBALANCE [J].
MUELLER, RM ;
WHITE, W .
REVIEW OF SCIENTIFIC INSTRUMENTS, 1968, 39 (03) :291-&
[6]  
Sauerbrey G., 1959, PHYSIK, V155, P206, DOI DOI 10.1021/AM505510M
[7]  
Sosman R. B., 1927, PROPERTIES SILICA
[8]  
Stockbridge CD, 1966, VACUUM MICROBALANCE, V5, P193
[9]  
WARNER AW, 1969, ULTRA MICRO WEIGHT D, P137
[10]  
1963, AM I PHYSICS HDB, P3