INFORMATION ON SYMMETRY ANALYSIS BY CONVERGENT-BEAM ELECTRON-DIFFRACTION

被引：0

作者：

TANAKA, M ^{[1
]}

机构：

[1] TOHOKU UNIV,DEPT PHYS,SENDAI,MIYAGI 980,JAPAN

来源：

JOURNAL OF ELECTRON MICROSCOPY | 1989年 / 38卷 / 01期

关键词：

D O I：

暂无

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

引用

页码：72 / 72

页数：1

共 50 条

[41] CONVERGENT BEAM ELECTRON-DIFFRACTION AND THE DETERMINATION OF CRYSTAL SYMMETRY
MUDDLE, BC
METALS FORUM, 1985, 8 (2-3): : 93 - 108
[42] DETERMINATION OF THE SIGN OF A DISLOCATION IN A ZNTE CRYSTAL BY CONVERGENT-BEAM ELECTRON-DIFFRACTION
NIU, F
WANG, R
LU, G
ACTA CRYSTALLOGRAPHICA SECTION A, 1991, 47 : 36 - 39
[43] THE DIRECT OBSERVATION AND UTILIZATION OF DYNAMIC PHASE IN CONVERGENT-BEAM ELECTRON-DIFFRACTION
MOODIE, AF
FEHLMANN, M
ACTA CRYSTALLOGRAPHICA SECTION A, 1993, 49 : 376 - 378
[44] SYMMETRIES OF CONVERGENT-BEAM ELECTRON-DIFFRACTION PATTERNS FROM MODULATED STRUCTURES
TANAKA, M
TERAUCHI, M
JOURNAL OF ELECTRON MICROSCOPY, 1989, 38 (04): : 264 - 264
[45] 3-DIMENSIONAL STRAIN-FIELD INFORMATION IN CONVERGENT-BEAM ELECTRON-DIFFRACTION PATTERNS
CARPENTER, RW
SPENCE, JCH
ACTA CRYSTALLOGRAPHICA SECTION A, 1982, 38 (JAN): : 55 - &
[46] OBSERVATION OF PHASE-CONTRAST IN CONVERGENT-BEAM ELECTRON-DIFFRACTION PATTERNS
VINE, WJ
VINCENT, R
SPELLWARD, P
STEEDS, JW
ULTRAMICROSCOPY, 1992, 41 (04) : 423 - 428
[47] DETERMINATION OF THE CRYSTAL SYMMETRY OF 2 AL-FE-SI PHASES BY CONVERGENT-BEAM ELECTRON-DIFFRACTION
LIU, P
DUNLOP, GL
JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1987, 20 (05) : 425 - 427
[48] CONVENTIONAL TRANSMISSION-ELECTRON-MICROSCOPY TECHNIQUES IN CONVERGENT-BEAM ELECTRON-DIFFRACTION
TANAKA, M
JOURNAL OF ELECTRON MICROSCOPY, 1986, 35 (04): : 314 - 323
[49] COMPARISON OF CONVERGENT-BEAM ELECTRON-DIFFRACTION METHODS FOR DETERMINATION OF FOIL THICKNESS
GLAZER, J
RAMESH, R
HILTON, MR
SARIKAYA, M
PHILOSOPHICAL MAGAZINE A-PHYSICS OF CONDENSED MATTER STRUCTURE DEFECTS AND MECHANICAL PROPERTIES, 1985, 52 (06): : L59 - L63
[50] APPLICATION OF IMAGING PLATES IN OBSERVING CONVERGENT-BEAM ELECTRON-DIFFRACTION PATTERNS
TSUDA, K
TANAKA, M
OIKAWA, T
JOURNAL OF ELECTRON MICROSCOPY, 1991, 40 (04): : 279 - 279

← 1 2 3 4 5 →