INFORMATION ON SYMMETRY ANALYSIS BY CONVERGENT-BEAM ELECTRON-DIFFRACTION

被引：0
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作者：
TANAKA, M [1 ]
机构：
[1] TOHOKU UNIV,DEPT PHYS,SENDAI,MIYAGI 980,JAPAN
来源：
JOURNAL OF ELECTRON MICROSCOPY | 1989年 / 38卷 / 01期
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TH742 [显微镜];
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页码：72 / 72
页数：1
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