INFORMATION ON SYMMETRY ANALYSIS BY CONVERGENT-BEAM ELECTRON-DIFFRACTION

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作者：

TANAKA, M ^{[1
]}

机构：

[1] TOHOKU UNIV,DEPT PHYS,SENDAI,MIYAGI 980,JAPAN

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JOURNAL OF ELECTRON MICROSCOPY | 1989年 / 38卷 / 01期

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TH742 [显微镜];

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页码：72 / 72

页数：1

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