CRITICAL ANALYSIS OF ELECTRICAL CONTACTS TO LAYERED SEMICONDUCTORS FOR USE IN (PHOTO)ELECTROCHEMICAL STUDIES

被引：6

作者：

ETMAN, M ^{[1
]}

NEUMANNSPALLART, M ^{[1
]}

机构：

[1] LAB PHYS SOLIDE, CNRS, F-92195 MEUDON, FRANCE

来源：

JOURNAL OF ELECTROANALYTICAL CHEMISTRY | 1989年 / 269卷 / 02期

关键词：

D O I：

10.1016/0022-0728(89)85148-4

中图分类号：

O65 [分析化学];

学科分类号：

070302 ; 081704 ;

摘要：

引用

页码：411 / 422

页数：12

共 115 条

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